Work

A sparse representation defect imaging method based on eddy current tomography

Year: 2025

Type: article

Source: Measurement Science and Technology

DOI: 10.1088/1361-6501/ade617

Authors: Pu Huang, Jinqin Guo, Feng Li, Jiyao Li, Keyu Du, Xiaoxuan Geng, Yuedong Xie

Institutions: Tsinghua University, Taiyuan Institute of Technology, Beihang University

Language: English

Topic: Non-Destructive Testing Techniques

Subfield: Mechanical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G2040558329

OpenAlex ID: W4411443358

FWCI: 0.603

Cites: 26

Cited by: 2

Related to: 10