Work

A Low Overhead Single Event Transient Tolerant Bandgap Reference Based on Radiation-Hardened-By-Design (RHBD) Technique

Year: 2025

Type: article

Source: IEEE Transactions on Aerospace and Electronic Systems

DOI: 10.1109/taes.2025.3581179

Authors: Chunyu Peng, Neng Wan, Qiang Zhao, Chenghu Dai, Licai Hao, Zhiting Lin, Xiulong Wu

Institution: Anhui University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Natural Science Foundation of Anhui Province, Anhui Provincial Key Research and Development Plan

Awards: G1398806729, G8331222254, G8905193691

OpenAlex ID: W4411446279

FWCI: 0.231

Cites: 19

Cited by: 1

Related to: 10