Work

Single-Event Upset Monitor-Based Radiation-Hardened Latch for Multi-Node Upset

Year: 2025

Type: article

Source: IEEE Transactions on Circuits & Systems II Express Briefs

DOI: 10.1109/tcsii.2025.3582493

Authors: Zhan Zheyu, Liu Hainan, Li Duoli, Ma Quangang, Zhao Wenxin, Yan Zhenzhen, Li Bo

Institutions: Chinese Academy of Sciences, Institute of Microelectronics

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Chinese Academy of Sciences

OpenAlex ID: W4411551091

FWCI: 0.693

Cites: 20

Cited by: 3

Related to: 10