Work

A Fault Injection Method for Evaluating Single Event Soft Errors in Deep Neural Networks

Year: 2025

Type: conference-paper

Source: International Conference on Radiation Effects of Electronic Devices (ICREED)

DOI: 10.1109/icreed65908.2025.11036247

Authors: He Lyu, Bo Mei, Pengchao Xue, Bo Wang, Rigen Mo, Qifei Yuan, Wu Gao

Institutions: Northwestern Polytechnical University, China Academy of Space Technology

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411552445

FWCI:

Cites: 22

Cited by:

Related to: 10