Work

New Observations on Carrier Transport and Thermal Behavior in IGBT During Heavy-ion Radiation

Year: 2025

Type: conference-paper

Source: International Conference on Radiation Effects of Electronic Devices (ICREED)

DOI: 10.1109/icreed65908.2025.11036222

Authors: Lu Mi, Shiwei Liang, Jiaqi Chene, Liu Yang, Daming Wang, Xinyi Tu, Jun Wang, Wanjun Chen

Institutions: Hunan University, University of Electronic Science and Technology of China, State Key Laboratory of Electronic Thin Films and Integrated Devices

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411552514

FWCI:

Cites: 6

Cited by:

Related to: 10