Work

SEE Characterization of NOR Flash in Dynamic Operation Mode for Aerospace Application

Year: 2025

Type: conference-paper

Source: International Conference on Radiation Effects of Electronic Devices (ICREED)

DOI: 10.1109/icreed65908.2025.11036216

Authors: Wei Cao, Lei Chen, Jiancheng Li, Qichao Zha, Xin Li, Fubang An, Lifeng Qi, Yimao Cai

Institutions: Beijing Microelectronics Technology Institute, Peking University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411552528

FWCI:

Cites: 15

Cited by:

Related to: 10