Work

Angular Sensitivity of Heavy-Ion-Induced Single-Event Transient Pulse Widths for Bulk FinFET Technology

Year: 2025

Type: conference-paper

Source: International Conference on Radiation Effects of Electronic Devices (ICREED)

DOI: 10.1109/icreed65908.2025.11036187

Authors: Yang Bai, Tongde Li, Yongqin Zhu, Yu Sun, Jingshuang Yuan, Liang Wang

Institutions: Chinese Academy of Sciences, China Aerospace Science and Technology Corporation, Beijing Microelectronics Technology Institute

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411552532

FWCI: 2.358

Cites: 6

Cited by: 1

Related to: 10