Work

Investigation of Electrical Performance Degradation and Trap States in Depletion-Mode Metal-Insulator-Semiconductor (MIS) GaN HEMTs Under Heavy Ion Irradiation

Year: 2025

Type: conference-paper

Source: International Conference on Radiation Effects of Electronic Devices (ICREED)

DOI: 10.1109/icreed65908.2025.11036202

Authors: Can Zou, Yiteng Yu, Peipei Hu, Hai Lu, Feng Zhou, Chongrui Shu, Pengfei Zhai, Junfan Qian, Mai Zhang, Jie Liu

Institutions: Nanjing University, Chinese Academy of Sciences, Institute of Modern Physics

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411552549

FWCI: 2.358

Cites: 13

Cited by: 1

Related to: 10