Work

Radiation Effects Modeling and Analysis in RRAM-Based In-Memory Computing Systems

Year: 2025

Type: conference-paper

Source: International Conference on Radiation Effects of Electronic Devices (ICREED)

DOI: 10.1109/icreed65908.2025.11036223

Authors: Tingrui Ren, Xvpeng Han, Kexin Yao, Huimeng Guo, Liang Wang, Yuanfu Zhao, Bi Wang

Institutions: Beihang University, Beijing Microelectronics Technology Institute, Hangzhou Dianzi University

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411552551

FWCI:

Cites: 10

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Related to: 10