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Radiation Effects on the Reliability of SRAM Physical Unclonable Functions

Year: 2025

Type: conference-paper

Source: International Conference on Radiation Effects of Electronic Devices (ICREED)

DOI: 10.1109/icreed65908.2025.11036200

Authors: Yujia Li, Chenge Dong, Huimeng Guo, Chunqing Yu, Zengqiang Zhang, Xin Ma, Liang Wang, Yuanfu Zhao

Institutions: Beijing Microelectronics Technology Institute, Beihang University, Hangzhou Dianzi University

Language: English

Topic: Physical Unclonable Functions (PUFs) and Hardware Security

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411552565

FWCI:

Cites: 7

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Related to: 10