Work

Real-Time Soft Error Mitigation System for SRAM-Based FPGAs

Year: 2025

Type: conference-paper

Source: International Conference on Radiation Effects of Electronic Devices (ICREED)

DOI: 10.1109/icreed65908.2025.11036219

Authors: Hanxu Feng, Jing Zhou, Shuo Wang, Zhuoli Wang, Jie Li, Yuanhang Bu, Chunsheng Tian

Institution: Beijing Microelectronics Technology Institute

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411552583

FWCI: 2.358

Cites: 8

Cited by: 1

Related to: 10