Work

Research on a Method for Evaluating SEL and SEU in a Time-Interleaved High-Speed ADC

Year: 2025

Type: conference-paper

Source: International Conference on Radiation Effects of Electronic Devices (ICREED)

DOI: 10.1109/icreed65908.2025.11036193

Authors: Wei Jiang, Yafeng Wei, Xianchao Wen, Zhou Yu, Dongbin Fu, Tianqi Wang

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411552597

FWCI:

Cites: 4

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Related to: 10