Work

Failure Mechanism and Layout Reinforcement for Enhancing Single-Event Tolerance in 4H-Silicon Carbide Inverters

Year: 2025

Type: conference-paper

Source: International Conference on Radiation Effects of Electronic Devices (ICREED)

DOI: 10.1109/icreed65908.2025.11036199

Authors: Yurui Yang, Yong Gu, Jie Ma, Long Zhang, Siyang Liu, Weifeng Sun

Institutions: Southeast University, Southeast University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411552722

FWCI:

Cites: 11

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Related to: 10