Work

Heavy Ion Irradiation-Induced Electrical Degradation and Leakage Mechanism in Quasi-Vertical GaN PiN Diodes

Year: 2025

Type: conference-paper

Source: International Conference on Radiation Effects of Electronic Devices (ICREED)

DOI: 10.1109/icreed65908.2025.11036246

Authors: Junfan Qian, Feng Zhou, Yiteng Yu, Chongrui Shu, Mai Zhang, Tianqi Wang, Zhengliang Zhang, Hai Lu

Institutions: Nanjing University, Harbin Institute of Technology

Language: English

Topic: GaN-based semiconductor devices and materials

Subfield: Condensed Matter Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411552730

FWCI:

Cites: 21

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Related to: 10