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Test Intention Guided LLM-Based Unit Test Generation

Year: 2025

Type: conference-paper

Source: IEEE/ACM International Conference on Software Engineering (ICSE)

DOI: 10.1109/icse55347.2025.00243

Authors: Zifan Nan, Zhaoqiang Guo, Kui Liu, Xin Xia

Institution: Huawei Technologies (China)

Language: English

Topic: Software Testing and Debugging Techniques

Subfield: Software

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411552855

FWCI: 17.62

Cites: 36

Cited by: 22

Related to: 10