Work

Predictive Modeling for Critical Defects Using CNN-Random Forest Fusion

Year: 2024

Type: conference-paper

Source: International Conference on Control, Computing, Communication and Materials (ICCCCM)

DOI: 10.1109/iccccm61016.2024.11039993

Authors: Deepak Banerjee, Neha Sharma, Priyanshi Aggarwal, Mukesh Singh

Institutions: Chitkara University, Graphic Era Hill University, Graphic Era University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411584140

FWCI:

Cites: 15

Cited by:

Related to: 10