Work

Coverage-Aware Contribution-based Test Case Reduction for Mutation-based Fault Localization

Year: 2025

Type: conference-paper

Source: International Conference on Advanced Electronic Materials, Computers and Software Engineering (AEMCSE)

DOI: 10.1109/aemcse65292.2025.11042645

Authors: Haifeng Wang, Kun Yang

Institution: National Institute of Metrology

Language: English

Topic: Software Testing and Debugging Techniques

Subfield: Software

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411584215

FWCI:

Cites: 15

Cited by:

Related to: 10