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A Tool Remaining Useful Life Prediction Model Based on Improved TCN Combined with BiGRU

Year: 2025

Type: conference-paper

Source: International Conference on Advanced Electronic Materials, Computers and Software Engineering (AEMCSE)

DOI: 10.1109/aemcse65292.2025.11042793

Authors: Xiangyu Pan, Hui Yi, Wenjun Zhong

Institution: Nanjing Tech University

Language: English

Topic: Machine Fault Diagnosis Techniques

Subfield: Control and Systems Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411584969

FWCI:

Cites: 3

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Related to: 10