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Enhancing Composite Micrograph Analysis With Semantic Segmentation

Year: 2025

Type: conference-paper

DOI: 10.33599/nasampe/s.25.0098

Authors: Jonas Naumann, Jonas Appels, Philipp Sämann, Timo de Wolff, Christoph Brauer

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411598556

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