Work

Innovative Approach to Predicting Sheet Metal Narrow Strip Defects: CNN-SVM Harmony

Year: 2024

Type: conference-paper

Source: International Conference on Control, Computing, Communication and Materials (ICCCCM)

DOI: 10.1109/iccccm61016.2024.11039932

Authors: Taifa Ayoub Mir, Deepak Banerjee, Rahul Chauhan, Hemant Singh Pokhariya, Gotte Ranjith Kumar

Institutions: Chitkara University, Graphic Era Hill University, Graphic Era University, SR University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411600341

FWCI:

Cites: 15

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Related to: 10