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A Novel Hybrid Model for Printed Circuit Board Defect Classification: CNN Meets Random Forest

Year: 2024

Type: conference-paper

Source: International Conference on Control, Computing, Communication and Materials (ICCCCM)

DOI: 10.1109/iccccm61016.2024.11039892

Authors: Vishal Yadav, Deepak Banerjee, Amit Gupta, Vijay Singh

Institutions: Chitkara University, Graphic Era Hill University, Graphic Era University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411600405

FWCI:

Cites: 17

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Related to: 10