A Blend of Deep Learning and Machine Learning based Tamper detection of medical images followed by localization and self-recovery
Year: 2025
Type: conference-paper
Authors: Samudrala Jagadeesh, Ami Kumar Parida, Kollati Meenakshi
Institution: GIET University
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4411600488