Work

Neural Network-Enhanced Fault-Tolerant SRAM with Adaptive Error-Correcting Code

Year: 2025

Type: conference-paper

Source: International Conference on Augmented Intelligence and Sustainable Systems (ICAISS)

DOI: 10.1109/icaiss61471.2025.11042236

Authors: B. Subbarayudu, D. Navanishwar Reddy, C. Satheesh Kumar, D. Sai Kiran Reddy

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411600510

FWCI:

Cites: 13

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Related to: 10