Work

Single Event Effect Analysis of Complementary Full-Scale Dynamic Comparators

Year: 2025

Type: conference-paper

Source: International Conference on Information Science, Electrical and Automation Engineering (ISEAE)

DOI: 10.1109/iseae64934.2025.11041843

Authors: Shengkun Zhang, Junqi Hong, Yunling Yang, Nan Li

Institution: National University of Defense Technology

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411600603

FWCI:

Cites: 6

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Related to: 10