Work

Detection Impact of Synthetic Defective Wafer Map Images Generated by Enhanced-CycleGAN

Year: 2025

Type: conference-paper

Source: IEEE Dallas Circuits and Systems Conference (DCAS)

DOI: 10.1109/dcas65331.2025.11045474

Authors: Lamia Alam, Nasser Kehtarnavaz

Institution: The University of Texas System

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411640447

FWCI: 2.448

Cites: 20

Cited by: 1

Related to: 10