Work

Deep Spoil: A Deep Learning-Based model for Accurate Food Spoilage Detection

Year: 2025

Type: conference-paper

Source: International Conference on Research Methodologies in Knowledge Management, Artificial Intelligence and Telecommunication Engineering (RMKMATE)

DOI: 10.1109/rmkmate64874.2025.11042472

Authors: Maithili Chigurupati, Anupama Gopavarapu, Naresh Sammeta

Institution: VIT-AP University

Language: English

Topic: Advanced Neural Network Applications

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

SDG: Zero hunger

Open Access status: closed

OpenAlex ID: W4411640526

FWCI: 0.798

Cites: 4

Cited by: 1

Related to: 10