Work

Analysis of Sub-Sampling PLL False Lock and Lock-in Range Estimation

Year: 2025

Type: conference-paper

Source: IEEE International Symposium on Circuits and Systems proceedings

DOI: 10.1109/iscas56072.2025.11043672

Authors: Wenzhe Chen, Tian Xia

Institution: University of Vermont

Language: English

Topic: Advancements in PLL and VCO Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411725000

FWCI: 2.358

Cites: 11

Cited by: 1

Related to: 10