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On Securing SSN Architecture using Test Vector Encryption

Year: 2025

Type: conference-paper

Source: IEEE International Symposium on Circuits and Systems proceedings

DOI: 10.1109/iscas56072.2025.11043163

Authors: Anjum Riaz, Pardeep Kumar, Yamuna Prasad, Satyadev Ahlawat

Institution: Indian Institute of Technology Jammu

Language: English

Topic: Physical Unclonable Functions (PUFs) and Hardware Security

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4411725253

FWCI: 1.784

Cites: 19

Cited by: 2

Related to: 10