Work

Monte Carlo Simulation-Based Method for Evaluating Sample Thickness Variation to Improve Reliability of Dielectric Strength Assessment

Year: 2025

Type: article

Abstract: This study investigated the thickness effect (the influence of sample thickness variation) on the assessment of the dielectric breakdown strength in XLPE and PP insulators. A Monte Carlo simulation (MCS) was conducted to quantify the impact of voltage and thickness on the dielectric strength. Aimed at improving power system reliability, the study sought to provide a quantitative basis for the thickness effect and propose a reasonable range of thickness variation, specifically between 0.2 mm and 1.1 mm. The simulation was repeated 1,000 times by modeling thickness deviations ranging from 1% to 10%. Levene’s test was used to assess the homogeneity of variance between an ideal group with a 1% thickness deviation and comparison groups with larger deviations. The proportion of cases where Levene’s test produced a p-value below the significance level reduced below 80% when the thickness variation exceeded 2.5%. This verified that the variance differences were statistically significant. This result (particularly for samples with thicknesses of at most 1 mm) provides a scientific basis for establishing tolerance standards for thickness variation. Thereby, it contributes to enhancing the reliability of dielectric strength testing methods.

Source: IEEE Access

DOI: 10.1109/access.2025.3583892

Authors: Keon-Hee Park, Seung-Won Lee, Hae-Jong Kim, Jang-Seob Lim

Institutions: Mokpo National Maritime University, Korea Electrotechnology Research Institute

Language: English

Topic: High voltage insulation and dielectric phenomena

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: gold

Estimated APC paid: $2,075

Funder: Ministry of Science and ICT, South Korea