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Cross-Space Alignment-based Attribute Artifact Removal for V-PCC

Year: 2025

Type: conference-paper

Source: IEEE International Symposium on Circuits and Systems proceedings

DOI: 10.1109/iscas56072.2025.11043854

Authors: Yu Liu, Mingfei Hu, Qiang Zhu, Zeliang Li, Siu-Kei Au Yeung, Shuyuan Zhu, Lihuo He, Fan Zhang

Institutions: University of Electronic Science and Technology of China, Hong Kong Metropolitan University, Xidian University, University of Bristol

Language: English

Topic: 3D Shape Modeling and Analysis

Subfield: Computational Mechanics

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Natural Science Foundation of Sichuan Province

OpenAlex ID: W4411725926

FWCI:

Cites: 16

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Related to: 10