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Instantaneous Capacitance Matching based Current Response Algorithm for EM Reliability Analysis

Year: 2025

Type: conference-paper

Source: IEEE International Symposium on Circuits and Systems proceedings

DOI: 10.1109/iscas56072.2025.11043539

Authors: Zongfeng Ma, Zhong Guan

Institution: Sun Yat-sen University

Language: English

Topic: Copper Interconnects and Reliability

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4411726052

FWCI:

Cites: 12

Cited by:

Related to: 10