Work

QuickTrace: An Efficient Contour Tracing Algorithm for Defect Robustness Simulation of Silicon Dangling Bond Logic

Year: 2025

Type: conference-paper

Source: IEEE International Symposium on Circuits and Systems proceedings

DOI: 10.1109/iscas56072.2025.11044082

Authors: Jan Drewniok, Marcel Walter, Robert Wille

Institution: Technical University of Munich

Language: English

Topic: Quantum-Dot Cellular Automata

Subfield: Computational Theory and Mathematics

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411726196

FWCI: 3.964

Cites: 18

Cited by: 2

Related to: 10