Work

Radiation-Hardened Design of TCAM for Single-Event Upset Tolerance

Year: 2025

Type: conference-paper

Source: IEEE International Symposium on Circuits and Systems proceedings

DOI: 10.1109/iscas56072.2025.11043570

Authors: Jiaqi You, Erya Deng, Zhongkun Shen, You Wang, Weiqiang Liu

Institution: Nanjing University of Aeronautics and Astronautics

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Fundamental Research Funds for the Central Universities

OpenAlex ID: W4411726288

FWCI: 2.32

Cites: 22

Cited by: 1

Related to: 10