Research on Reliability of MMC Type Medium-Voltage Power Quality Control Device Based on NL-PWM
Year: 2025
Type: conference-paper
Authors: Hanwen Zhang, Zipeng Xia, Jiayuan Lai, Xiaopeng Guo, Heng Peng, Ruotian Yao
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4411726561
