Work

Mitigation of Vertical Fixed Pattern Noise in CMOS Image Sensors through Analog Offset Dithering and Dynamic Clock Adjustment

Year: 2025

Type: conference-paper

Source: IEEE International Symposium on Circuits and Systems proceedings

DOI: 10.1109/iscas56072.2025.11044268

Authors: Jaejin Jung, Sungyong Kim, Shinhwan Lim, Kyoungmin Koh, Hae-Seung Lee

Institutions: Samsung (South Korea), Samsung Electronics (South Korea), Massachusetts Institute of Technology

Language: English

Topic: CCD and CMOS Imaging Sensors

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411726743

FWCI:

Cites: 3

Cited by:

Related to: 10