“Eye Pattern Estimation for Signal Integrity Analysis in EV PCB Designs”
Year: 2025
Type: conference-paper
Authors: Sivanandam K, Adhithyan G, Anguraj Karthick V, Gajendran P, Gopinath K
Institution: M. Kumarasamy College of Engineering
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4411727186