Condition Monitoring Method of Metallized Film Capacitor in MMC Based on ESR Frequency Characteristic Curve
Year: 2025
Type: conference-paper
Authors: Lingqi Tan, Ying Li, Cheng Yao, Kai Ma, Liantao Jiang, Lulu Yao, Sen Meng
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4411727581
