Work

Normality Addition via Normality Detection in Industrial Image Anomaly Detection Models

Year: 2024

Type: conference-paper

Abstract: normality within images based on textual descriptions.We then modify the results of a pre-trained IAD model to implement this normality addition.Using the benchmark dataset in IAD, MVTec AD, we establish an evaluation protocol for the normality addition task and empirically demonstrate the effectiveness of the NAND method.

DOI: 10.1145/3703935.3703977

Authors: Jihun Yi, Dahuin Jung, Sungroh Yoon

Institutions: Seoul National University, Soongsil University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: gold

Funders: National Research Foundation, Seoul National University, National Research Foundation of Korea, Ministry of Science and ICT, South Korea, Samsung, Institute for Information and Communications Technology Promotion

Awards: G1152552616, G1251031942, G2586176782, G30685149, G5065061179, G5635159257, G7092917899

OpenAlex ID: W4411729914

FWCI:

Cites: 14

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Related to: 10