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A Universal Method to Regulate Contact Resistance in Thin Film Transistors

Year: 2025

Type: conference-paper

Source: IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

DOI: 10.1109/edtm61175.2025.11041378

Authors: Yanzhuo Wei, Guohui Li, Yanxia Cui, Hongwei Hao, Chen Chen, Dongdong Li, Shan-Ting Zhang

Institutions: Shanghai Zhangjiang Laboratory, Zhangjiang Laboratory, Taiyuan University of Technology

Language: English

Topic: Thin-Film Transistor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411799142

FWCI:

Cites: 19

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Related to: 10