Work

Investigation of Reliability and Optimization of Reprogram Process in 3D NAND Flash Memory Based on Physical Model

Year: 2025

Type: conference-paper

Source: IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

DOI: 10.1109/edtm61175.2025.11040181

Authors: Jooyoung Lee, Jinil Yoo, Hyungcheol Shin

Institution: Seoul National University

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411799200

FWCI: 4.717

Cites: 11

Cited by: 2

Related to: 10