Work

On the Understanding of Temperature Dependence of Flicker Noise in Advanced FinFET Technology

Year: 2025

Type: conference-paper

Source: IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

DOI: 10.1109/edtm61175.2025.11040500

Authors: Sheng Yang, Shuying Wang, Chenyang Zhang, Yewei Zhang, Yongkang Xue, Pengpeng Ren, Zhigang Ji

Institutions: Shanghai Jiao Tong University, National Key Laboratory of Science and Technology on Micro/Nano Fabrication

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411799221

FWCI:

Cites: 2

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Related to: 10