Work

Wide Temperature Behavior Analyses of SiGe HBTs Based on Small-Signal Parameter Extraction Method

Year: 2025

Type: conference-paper

Source: IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

DOI: 10.1109/edtm61175.2025.11041412

Authors: Lu Zhao, Guofang Yu, Jie Cui, Yue Zhao, Jun Fu, Yanyan Liu

Institutions: Beijing National Research Center for Information Science and Technology, Tsinghua University, Nankai University

Language: English

Topic: Radio Frequency Integrated Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G4237251779

OpenAlex ID: W4411799236

FWCI:

Cites: 7

Cited by:

Related to: 10