Work

Categorization of Stacking Faults and Their Effects on I-V Characteristics in 2NM P-Type GAA Nanosheet Transistors

Year: 2025

Type: conference-paper

Source: IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

DOI: 10.1109/edtm61175.2025.11041126

Authors: Seungjoon Eom, Sanguk Lee, Rock-Hyun Baek

Institution: Pohang University of Science and Technology

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411799251

FWCI: 2.358

Cites:

Cited by: 1

Related to: 10