Work

Decoupling Polarization and Trap Charges by Direct Vmid Measurement for Insights into Dynamic Mechanisms of MFMIS-FeFET

Year: 2025

Type: conference-paper

Source: IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

DOI: 10.1109/edtm61175.2025.11041435

Authors: Wenpu Luo, Runteng Zhu, Hanyong Shao, Yuejia Zhou, Ru Huang, Kechao Tang

Institution: Peking University

Language: English

Topic: Ferroelectric and Negative Capacitance Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Higher Education Discipline Innovation Project, National Key Research and Development Program of China

Awards: G2010566908, G5962490683, G7436698130

OpenAlex ID: W4411799269

FWCI: 7.075

Cites: 8

Cited by: 3

Related to: 10