Work

Self-Heating and Process Induced Performance Barrier on Complementary Field Effect Transistor: A Reliability Perspective

Year: 2025

Type: conference-paper

Source: IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

DOI: 10.1109/edtm61175.2025.11041030

Authors: Sandeep Kumar, Deven H Patil, Khushi Jain, Ankit Dixit, Sunil Rathore, Mohd. Shakir, Naveen Kumar, Vihar Georgiev, S. Dasgupta, Navjeet Bagga

Institutions: Indian Institute of Technology Bhubaneswar, University of Glasgow, Indian Institute of Technology Roorkee

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411799286

FWCI: 2.3

Cites: 6

Cited by: 1

Related to: 10