Work

Benchmarking of the BSIM-BULK for Cryo-CMOS Design

Year: 2025

Type: conference-paper

Source: IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

DOI: 10.1109/edtm61175.2025.11041565

Authors: Wajid Manzoor, Nisha Manzoor, Yawar Hayat Zarkob, Debashish Nandi, Aloke K. Dutta, Yogesh Singh Chauhan

Institution: Indian Institute of Technology Kanpur

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411799320

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Cites: 7

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Related to: 10