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A Novel De-Mirroring Approach for Bias-Dependent Capacitance Extraction in Nanosheet Fet Using Conformal Mapping

Year: 2025

Type: conference-paper

Source: IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

DOI: 10.1109/edtm61175.2025.11040749

Authors: Deven H Patil, Sandeep Kumar, Sunil Rathore, S. Dasgupta, Navjeet Bagga

Institutions: Indian Institute of Technology Bhubaneswar, Manipal Academy of Higher Education, Indian Institute of Technology Roorkee

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411799343

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Cites: 5

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Related to: 10