Selecting Device, In-Memory Search, and Monolithic 3D Integration of RRAMs and 2D Devices Towards High Reliability and High Efficiency: (Invited Paper)
Year: 2025
Type: conference-paper
Authors: Rui Yang, Yueyang Jia, Maosong Xie, Minliang Shen, Yijian Zhang, Yuzhuo Liu
Institutions: Shanghai Jiao Tong University, University of Michigan
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G1427554791, G3499156831, G4589815452
OpenAlex ID: W4411799352
