Work

Comprehensive Investigation of the Disturb and Retention Issues in Scaled FeNAND Arrays

Year: 2025

Type: conference-paper

Source: IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

DOI: 10.1109/edtm61175.2025.11040722

Authors: Yuejia Zhou, Ru Huang, Kechao Tang

Institution: Peking University

Language: English

Topic: Ferroelectric and Negative Capacitance Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411799383

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Cites: 7

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Related to: 10