Work

Consideration of VFET for Ultimate Logic Scaling: A Design Perspective

Year: 2025

Type: conference-paper

Source: IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

DOI: 10.1109/edtm61175.2025.11040360

Authors: Yimeng Wang, Yanbang Chu, Ziqiao Xu, Yu Liu, Rui Guo, Jiacheng Sun, Wanyue Peng, Haoran Lu, Ming Li, Runsheng Wang, Heng Wu, Ru Huang

Institution: Peking University

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Key Research and Development Program of China

Award: G8344861315

OpenAlex ID: W4411799450

FWCI:

Cites: 1

Cited by:

Related to: 10